Ms. Donghee Lee passed the Korean Patent Attorney Examination in 2021 and has been practicing as a patent attorney at LEE & MOCK IP since 2022. She handles a broad range of intellectual property matters, including domestic and foreign patent and utility model applications, Office Action (OA) responses, registration procedures, and maintenance of rights.

She has handled intellectual property matters in various technical fields, including semiconductor-related cases for global semiconductor companies. Her practice covers a wide range of semiconductor technologies, including DRAM, NAND Flash, HBM, CMOS Image Sensors (CIS), logic devices, semiconductor packages, semiconductor processes, and semiconductor manufacturing equipment. In addition, she has experience in patent prosecution in advanced semiconductor fields, including semiconductor inspection and metrology technologies, optical proximity correction (OPC), process algorithms, wafer and package structures, photonics, and interposer technologies. Ms. Lee also has experience handling patent matters for global display companies, including technologies related to display devices, thin-film processes, light-emitting devices, inspection and metrology technologies, optical structures, and related manufacturing technologies. Through these experiences, she continues to broaden her understanding of electronic devices, manufacturing processes, inspection and metrology technologies, and optical technologies across the semiconductor and display industries. Ms. Lee also handles foreign patent prosecution and OA responses in major jurisdictions, including the United States, Europe, China, Japan, and Taiwan. Through close collaboration with foreign associates, she supports her clients in securing global intellectual property rights. Based on her academic background in physics, Ms. Lee has a strong technical understanding of semiconductor devices, fabrication processes, metrology, and optical technologies, and strives to appropriately reflect the technical core of each invention in patent specifications and claims. In particular, she works closely with inventors in technical areas including semiconductor processes and manufacturing equipment, packages, inspection and metrology, OPC, photonics, interposers, CIS, DRAM, NAND Flash, optics, quantum technologies, and nanostructures, preparing patent specifications and developing claim sets that faithfully capture the technical features of each invention.