Ms. Susanna Lee is a patent attorney and partner at LEE & MOCK IP. She majored in physics at both the undergraduate and graduate levels and worked at a corporate research institute for many years, before joining LEE & MOCK IP in 2005.

Her practice focuses on patent and utility model prosecution, IP trials, infringement analysis, and patent searches. In particular, she manages domestic and international patent applications, Office Action (OA) responses, and patent analysis for major Korean corporations. She possesses extensive hands-on experience in patent prosecution, trials, litigation, infringement analysis, and global OA responses across a wide range of technological sectors. Her areas of expertise include semiconductors, LEDs, lasers, memory, optics, displays, cameras, lenses, image sensors, LiDAR, and quantum computing devices.